Loading...
Equipment
Scanning electron microscope with field emission gun (FEG) electron source (Jeol JEM-7600F)
Purpose of equipment
The FEG-SEM is state-of-art scanning electron microscope that enables complete microstructural characterization of materials: image resolution of few nm, qualitative and quantitative chemical analysis on micron scale and electron litography.
Access of equipment
Responsible for equipment:
PhD Miran Čeh
Specific training is required to operate the equipment. Trained operaters can perform analyses for users from other research institutions. Price is dependent on a complexity of analyses.
Specific training is required to operate the equipment. Trained operaters can perform analyses for users from other research institutions. Price is dependent on a complexity of analyses.
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | P2-0084 | 1/1/2004 - 12/31/2008 | 5,560 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 95,032 |