Equipment source: ARIS

Atomic force microscope AFM

Edit
Purpose of equipment
AFM microscope provides information on topography on solid surfaces with very high spatial resolution. Analyses can be done over a region of 50 microns with accuracy of 0.1 nm. It is possible to measure the surface roughness, distribution of magnetic and electric fields and interaction forces between tip and substrate.
Access of equipment
Responsible for equipment: PhD Janez Kovač
Application for external users is possible, contact person dr. Janez Kovač
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P2-0082  TankThin-film structures and plasma surface engineering  1/1/2004 - 12/31/2008  PhD Anton Zalar  4,588 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  98,178 
Confirmation required
Views history
Favourite