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Equipment
XPS spectrometer
Purpose of equipment
Characterization of surfaces and thin films with X-Ray photoelectron spectroscopy – XPS (ESCA). XPS spectrometer provides quantitative data on surface composition and type of chemical bonds of elements in the thin surface layer of thickness of 3 – 5 nm. Analysed samples can be metals, oxides, composites, powders, ceramics, polymers… By ion sputtering it is possible to analyse depth distribution of elements in subsurface region and in thin films up to depth of about 200 nm.
Access of equipment
Responsible for equipment:
PhD Janez Kovač
Application for external users is possible, contact person dr. Janez Kovač
Application for external users is possible, contact person dr. Janez Kovač
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | P2-0082 | 1/1/2004 - 12/31/2008 | 4,517 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 95,032 |