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Equipment
Environmental scanning electron microscope
Purpose of equipment
The environmental scanning electron microscope (ESEM) enables morphological and chemical characterization of various inorganic and organic materials. The microscope is equipped with large specimen chamber, EDX system and software for 3D surface morphology presentation. It also enables observation of specimens at low vacuum (up to 4000 Pa) and is as such suitable for observation of not completely dried specimens.
Access of equipment
Responsible for equipment:
PhD Miran Čeh
The scanning electron microscope within the Center for Electron Microscopy and Microanalysis (CEMM) is accessible via the on-line reservation system to all JSI operators who have successfully completed a teaching course organized and conducted free of charge by the CEMM personnel . For those departments of the JSI, other research and educational institutions and industrial partners that do not have their own operators, the required analyses are performed by the CEMM personnel.
The scanning electron microscope within the Center for Electron Microscopy and Microanalysis (CEMM) is accessible via the on-line reservation system to all JSI operators who have successfully completed a teaching course organized and conducted free of charge by the CEMM personnel . For those departments of the JSI, other research and educational institutions and industrial partners that do not have their own operators, the required analyses are performed by the CEMM personnel.
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | I0-0005 | 1/1/2015 - 12/31/2021 | 4,595 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 95,032 |