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Equipment
Atomic force microscopy (AFM) with piezo-response force microscopy, conductive-atomic force microscopy and magnetic-force microscopy moduli
Purpose of equipment
An atomic force microscope with various modules is a very useful tool for investigating the ferroelectric domain structure, ferroelectric, piezoelectric, and magnetic properties at the local (nanometer) level.
Access of equipment
Responsible for equipment:
PhD Hana Uršič Nemevšek
by agreement: hana.ursic@ijs.si
by agreement: hana.ursic@ijs.si
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | P2-0105 | 1/1/2015 - 12/31/2021 | 4,093 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 95,032 |