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Equipment
Automatic probe station for testing of electronic components
Purpose of equipment
The equipment is intended for testing microcircuits and measuring the properties of structured semiconductors. Contacting is conditioned by a test card, which is specially designed for the measured circuit.
Access of equipment
Responsible for equipment:
PhD Vladimir Cindro
Eqiuipment is available on demand. Please contact vladimir. cindro@ijs.si
Eqiuipment is available on demand. Please contact vladimir. cindro@ijs.si
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | P1-0135 | 1/1/2015 - 12/31/2021 | 4,335 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 95,032 |