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Equipment
Ion beam scanning system
Purpose of equipment
The ion beam scanning system is based on electrostatic lenses and enables uniform scanning of the MeV ion beam over flat samples. It is designed for highly uniform ion beam implantation at MeV energies over large target area. This allows us to homogeneously irradiate the samples with MeV ions and thus creating damage in the crystal lattice.
Access of equipment
Responsible for equipment:
PhD Sabina Markelj
Users will be able to access the equipment by proposing what they would like to implant or irradiate. The method of contact is via e-mail sabina.markelj@ijs.si.
Users will be able to access the equipment by proposing what they would like to implant or irradiate. The method of contact is via e-mail sabina.markelj@ijs.si.
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | P2-0405 | 1/1/2019 - 12/31/2027 | 4,203 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 95,032 |