Equipment
Semiconductor X-ray and gamma detectors for advanced ion beam analysis
The equipment enables the detection of emitted photons in the energy range of X-ray radiation and gamma rays with high efficiency and good energy resolution. The detection system forms the basis for performing PIXE/PIGE measurements in an external atmosphere using excitation with a focused beam of accelerated protons, which allows mapping the areal distribution of elements in a sample with micrometer spatial resolution.
Responsible for equipment:
Research equipment is located at the Microanalytical Center hosting an ion accelerator, which operates within the IJS Infrastructure Programme. The equipment is installed on the external-beam and is accessible by prior arrangement. Contact is available via email at primoz.pelicon@ijs.si .
Organisations (1)
| no. |
Code |
Research organisation |
City |
Registration number |
No. of publicationsNo. of publications |
| 1. |
0106 |
Jožef Stefan Institute |
Ljubljana |
5051606000 |
98,178 |