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Equipment
Atomic Force Microscope
Purpose of equipment
Atomic force microscopy is used to investigate the surface properties of materials. It is used for high-resolution imaging of the topography of various materials, and it enables simultaneous measurement of the electrical and mechanical properties of samples. Measurements can be performed in air or in a liquid medium, and it is suitable for imaging biological samples. It also enables force spectroscopy between surfaces in different media
Access of equipment
Responsible for equipment:
For first access, an arrangement with the administrator is required, followed by training in the use of the microscope and induction into independent operation of the microscope. Trained users access the system via the reservation system
For first access, an arrangement with the administrator is required, followed by training in the use of the microscope and induction into independent operation of the microscope. Trained users access the system via the reservation system
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 0106 | Ljubljana | 5051606000 | 98,178 |