Upgrade of the system for characterization of photonic integrated circuits

The equipment is intended for optical and electrical characterization of photonic integrated components and various photonic integrated circuits. Light is coupled into and out of the chip via an array of single-mode optical fibers. The upgraded setup enables measurements over a broadband wavelength range using an NKT DK01-Q019505-2 EVO supercontinuum laser and optical components for coupling the laser light into single-mode optical fiber. The microscopic system has also been upgraded for observation during measurements and for chip mounting using a vacuum pump. Electrical contacting (DC and, in the upgraded configuration, also RF) is implemented via an array of dedicated probe needles. The system includes laser sources (Santec TSL-570-P, 1480–1640 nm; NKT DK01-Q019505-2 EVO), optical power meters (Santec MPM-211-04-F, Santec OPM-200), an optical spectrum analyzer (Yokogawa AQ6370D), a polarization analyzer (Keysight N7781C), an automated measurement system with software (MLP SD100), and other accesories

Responsible for equipment: PhD Janez Krč
The external user shall contact the responsible person: Janez Krč (janez.krc@fe.uni-lj.si. 01 4768 843). The responsible person gives additionalinformation on the equipment. They check the suitability of the equipment for the intended measurements. The responsible person informs theuser about the procedure and rules of the use and terms of payment. The responsible person then puts the user in touch with the equipmentmanager (Andraž Debevc). They set a possible date for use.