Equipment source: ARIS

AFM Raman spectrometer

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Purpose of equipment
TERS (Tip enhanced Raman spectroscopy) ready imaging Raman microscope – NT-MDT model »Integra Spectra for Material Science« provides »the same spot« coupled confocal Raman – AFM measurements with atomic resolution on samples of 50x50 mm size. Raman excitation lines at 488, 632.8 and 785 nm are available. Measurements are possible in the temperature range from 3.4 K to 500 K and at reduced pressure down to high vacuum (10-8 mbar).
Access of equipment
Responsible for equipment: PhD Adolf Jesih
first access upon agreement with responsible person, experienced operators through reservation system
ARIS research and infrastructure programmes (2) Legend
no. Code Title Period Head No. of publications
1.  P2-0091  Contemporary inorganic materials and nanotechnologies  1/1/2009 - 12/31/2014  PhD Danilo Suvorov  2,842 
2.  P1-0040  Dynamics of complex nano-systems  1/1/2009 - 12/31/2014  PhD Dragan D. Mihailović  2,381 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  3050  Center of excellence on nanoscience and nanotechnology - Nanocenter, Ljubljana  Ljubljana  3666255000  1,946 
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