Filters
cris logo
-
New search Filters
Select from list
Displayed from Show more
You have reached the maximum number of displayed search results.
All results displayed
No results are available for the search performed
Displayed from
You have reached the maximum number of displayed search results.
All results displayed
Loading results
Obtaining statistical data

Equipment source: ARIS

Atomic force microscope AFM

Edit
Purpose of equipment
AFM microscope provides information on topography on solid surfaces with very high spatial resolution. Analyses can be done over a region of 50 microns with accuracy of 0.1 nm. It is possible to measure the surface roughness, distribution of magnetic and electric fields and interaction forces between tip and substrate.
Access of equipment
Responsible for equipment: PhD Janez Kovač
URL: https://www.ijs.si/ijsw/Znotraj%20hi%C5%A1e/Desno?action=AttachFile&do=get&tar get=ARRS_Evidenca_opreme_2021.xlsx
Application for external users is possible, contact person dr. Janez Kovač
Research projects (3) Legend
no. Code Title Period Head No. of publications
1.  L7-4009  Functionalization of biomedical samples by thermodynamic non-equilibrium gaseous plasma  7/1/2011 - 6/30/2014  PhD Miran Mozetič  6,896 
2.  J2-4287  Organic-inorganic thin film structures for electronics components  7/1/2011 - 6/30/2014  PhD Janez Kovač  3,175 
3.  L2-4225  Synthesis of nanowires for regenerative energy cells  7/1/2011 - 6/30/2014  PhD Uroš Cvelbar  2,806 
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P2-0082  TankThin-film structures and plasma surface engineering  1/1/2004 - 12/31/2008  PhD Anton Zalar  4,251 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  90,767 
Confirmation required
Views history
Favourite