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Obtaining statistical data

Equipment source: ARIS

Double beam laser interferometer

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Purpose of equipment
Parallel measurements of electromechanical and electrical properties of thin dielectric films and nanostructured materials. The beam that hits the sample from the top and bottom side eliminates the influence of sample bending. The system enables (i) simultaneous electromechanical large signal strain and electrical polarization measurements, (ii) piezoelectric small signal coefficient and dielectric constant vs. bias voltage measurements, and (iii) measurements of the fatigue of electrical and electromechanical properties.
Access of equipment
Responsible for equipment:
URL: https://www.ijs.si/ijsw/Znotraj%20hi%C5%A1e/Desno?action=AttachFile&do=get&tar get=ARRS_Evidenca_opreme_2021.xlsx
Service available upon request, no special limitation. Contact: dr. Vid Bobnar, (01) 477-3172, vid.bobnar@ijs.si.
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P1-0125  Magnetic resonance and dielectric spectroscopy of "smart" new materials  1/1/2015 - 12/31/2021  PhD Janez Dolinšek  3,972 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  90,768 
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