Equipment
High-resolution FES SEM with EDX and STEM detector
The high-resolution FEG SEM scanning electron microscope enables the morphological characterization of various inorganic and organic materials at the nanometer level, even at very low excitation voltages. In addition, the microscope allows the determination of the chemical composition of materials since the microscope is equipped with the EDX system. A new quality is a detector for examining samples in transmission mode.
Responsible for equipment:
PhD Miran Čeh
URL:
https://www.ijs.si/ijsw/Znotraj%20hi%C5%A1e/Desno?action=AttachFile&do=get&tar
get=ARRS_Evidenca_opreme_2021.xlsx
The scanning electron microscope within the Center for Electron Microscopy and Microanalysis (CEMM) is accessible via the on-line reservation system to all JSI operators who have successfully completed a teaching course organized and conducted free of charge by the CEMM personnel . For those departments of the JSI, other research and educational institutions and industrial partners that do not have their own operators, the required analyses are performed by the CEMM personnel.
ARIS research and infrastructure programmes (1)
Legend
Organisations (1)
| no. |
Code |
Research organisation |
City |
Registration number |
No. of publicationsNo. of publications |
| 1. |
0106 |
Jožef Stefan Institute |
Ljubljana |
5051606000 |
90,767 |
