Filters
cris logo
-
New search Filters
Select from list
Displayed from Show more
You have reached the maximum number of displayed search results.
All results displayed
No results are available for the search performed
Displayed from
You have reached the maximum number of displayed search results.
All results displayed
Loading results
Obtaining statistical data

Equipment source: ARIS

Environmental scanning electron microscope

Edit
Purpose of equipment
The environmental scanning electron microscope (ESEM) enables morphological and chemical characterization of various inorganic and organic materials. The microscope is equipped with large specimen chamber, EDX system and software for 3D surface morphology presentation. It also enables observation of specimens at low vacuum (up to 4000 Pa) and is as such suitable for observation of not completely dried specimens.
Access of equipment
Responsible for equipment: PhD Miran Čeh
URL: https://www.ijs.si/ijsw/Znotraj%20hi%C5%A1e/Desno?action=AttachFile&do=get&tar get=ARRS_Evidenca_opreme_2021.xlsx
The scanning electron microscope within the Center for Electron Microscopy and Microanalysis (CEMM) is accessible via the on-line reservation system to all JSI operators who have successfully completed a teaching course organized and conducted free of charge by the CEMM personnel . For those departments of the JSI, other research and educational institutions and industrial partners that do not have their own operators, the required analyses are performed by the CEMM personnel.
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  I0-0005  Infrastrukturni program Instituta Jožef Stefan (Slovene)  1/1/2015 - 12/31/2021  PhD Miran Čeh  4,100 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  90,767 
Confirmation required
Views history
Favourite