Projects / Programmes
Thermal stability of sputter deposited multilayer structures
Code |
Science |
Field |
Subfield |
2.21.00 |
Engineering sciences and technologies |
Technology driven physics |
|
Code |
Science |
Field |
T155 |
Technological sciences |
Coatings and surface treatment |
multilayer structures, hard protective coatings, sputtering, standard reference materials, Rutherford backscattering, hot forging, ceramic thin films, wear resistance, interfacial reaction, oxidation, microhardness, adhesion, weight gain
Researchers (4)
no. |
Code |
Name and surname |
Research area |
Role |
Period |
No. of publicationsNo. of publications |
1. |
03494 |
PhD Marijan Maček |
Electronic components and technologies |
Researcher |
1998 - 1999 |
178 |
2. |
15603 |
Andrej Mohar |
|
Researcher |
1998 - 1999 |
2 |
3. |
00085 |
PhD Boris Navinšek |
Materials science and technology |
Researcher |
1998 - 1999 |
243 |
4. |
09090 |
PhD Peter Panjan |
Materials science and technology |
Head |
1998 - 1999 |
792 |
Organisations (2)
Abstract
The tribological performance of hard coatings is, for given substrate material, mainly governed by the coating hardness, toughness, fracture resistance, the contact temperature and chemistry. One possible way to achieve high hardness in combination with high toughness and high coating fracture resistance is to use multilayer coatings. This type of coatings are generally considered to have properties superior to single-layered coatings. Several multilayer PVD coatings consisting of TiN, CrN, TiAlN and CrCN layers deposited on high speed steel (HSS) were investigated. Multilayer coatings deposited on HSS substrates were evaluated with respect to fundamental properties such as morphology, microstructure, microhardness, adhesion and oxidation resistance. The investigation showed that the multilayer coatings have higher cracking resistance and better oxidation resistance than the single-layer coatings, while the microhardness of both systems is the same. Selected tools were protected with multilayer coatings and tested sucsesfully in industrial conditions.
Rutherford backscattering spectrometry (RBS) and weight gain technique (WG) were used for determination of nitrogen, oxygen or carbon content in transition metal compound films. The accuracy of the RBS method was improved using two detectors as well as a sample in the form of a multilayer structure composed of two or more layers of metal compound and a layer of pure metal. Thin film samples characterized in this way could be an appropriate standard reference materials for conventional compositional depth profile analysis (e.g. AES, XPS).
The interdiffusion and thermal stability of three types of metal/oxide (Cr/NiO, Cr2O3/Ni, Al2O3/Ti) were also studied with AES depth profiling. The main moving species and the activation energy for intefacial reactions were determined.