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Projects / Programmes source: ARIS

Študij materialov v vakuumski optoelektroniki z ekstremno nizkim razplinjevanjem (Slovene)

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Research activity

Code Science Field Subfield
2.09.04  Engineering sciences and technologies  Electronic components and technologies  Optoelectronics 

Code Science Field
T150  Technological sciences  Material technology 
T151  Technological sciences  Optical materials 
Keywords
vacuum science, opto-electronics, extreme high vacuum, low outgassing, surface analysis, low-voltage phosphors, anti-degradation coatings
Evaluation (rules)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Researchers (8)
no. Code Name and surname Research area Role Period No. of publications
1.  18635  Tatjana Filipič    Researcher  2000 - 2002  24 
2.  08028  Miha Kocmur    Researcher  2000 - 2002  15 
3.  15703  PhD Janez Kovač  Electronic components and technologies  Researcher  2000 - 2002  673 
4.  03066  PhD Vincenc Nemanič  Electronic components and technologies  Head  2000 - 2002  245 
5.  17622  Janez Trtnik    Researcher  2000 - 2002  18 
6.  20335  PhD Bojan Zajec  Civil engineering  Researcher  2000 - 2002  182 
7.  03366  Marko Žumer  Electronic components and technologies  Researcher  2000 - 2002  110 
8.  05758  PhD Lea Županc Mežnar  Chemistry  Researcher  2000 - 2002  38 
Abstract
The purpose of our studies will be finding a better correlation between the composition, structure and pre-treatment of inner vacuum surface (wall or any internal solid state element) and the outgassing rate. Stable ultrahigh vacuum within evacuated opto-electronic devices is one of the most important demands which must be fulfilled to meet the lifetime requirements. Better understanding of degradation processes on atomic scale may help to complete the picture on theoretical ground as well as it may have impact to any application in the future.
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