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Projects / Programmes source: ARIS

Electron microscopy of materials

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Periods
January 1, 1999 - December 31, 2003
Research activity

Code Science Field Subfield
2.04.00  Engineering sciences and technologies  Materials science and technology   
1.04.00  Natural sciences and mathematics  Chemistry   

Code Science Field
P250  Natural sciences and mathematics  Condensed matter: structure, thermal and mechanical properties, crystallography, phase equilibria 
T153  Technological sciences  Ceramic materials and powders 
P352  Natural sciences and mathematics  Surface and boundary layery chemistry 
P420  Natural sciences and mathematics  Petrology, mineralogy, geochemistry 
Evaluation (rules)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Researchers (9)
no. Code Name and surname Research area Role Period No. of publications
1.  06627  PhD Slavko Bernik  Materials science and technology  Researcher  2001 - 2003  621 
2.  03937  PhD Miran Čeh  Materials science and technology  Head  2001 - 2003  650 
3.  19029  PhD Nina Daneu  Materials science and technology  Researcher  2001 - 2003  424 
4.  05216  Medeja Gec    Researcher  2001 - 2003  42 
5.  20825  Boštjan Kaltnekar    Researcher  2001 - 2002  0 
6.  10083  PhD Aleksander Rečnik  Chemistry  Researcher  2001 - 2003  651 
7.  15597  PhD Zoran Samardžija  Materials science and technology  Researcher  2001 - 2003  577 
8.  21554  PhD Vesna Šrot  Materials science and technology  Researcher  2001 - 2003  60 
9.  19030  PhD Sašo Šturm  Materials science and technology  Researcher  2001 - 2003  649 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  90,753 
Abstract
The physical properties of technologically important polycrystalline materials (ceramics, metals, composites) are to great extent determined by the chemical composition and structure of internal boundaries, such as interfaces and planar faults (twins, polytypic faults, anti-phase boundaries, etc). Planar faults in particular often induce exaggerated and/or anisotropic growth of the crystalline matrix. The atomic-scale determination of the structure and chemical composition of such faults is therefore essential in order to understand their formation, which so pronouncedly influences evolution of the microstructure. Only when such planar faults are adequately characterized, can the mechanisms involved in grain growth be properly understood and the processing conditions for production of the material be altered accordingly, in order to achieve the requisite properties of the material. The aim of the proposed research program is therefore to characterize the structure and chemistry of internal boundaries and other microstructural features in a number of technologically important ceramic materials, such as functional ceramics, engineering ceramics, bioceramics, etc., using different electron microscopy techniques. The final goal of these studies is to determine the relations and general rules that correlate the structure and chemical composition of materials on the nano-scale with the resulting phenomena, such as exaggerated and/or anisotropic grain growth, polytypism, polymorphism and solid solubility. For such structural and chemical characterization, the following electron microscopy techniques will be used: scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDXS) and wave-dispersive X-ray spectroscopy (WDXS), transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), and scanning transmission electron microscopy (STEM) with bright-field (BF), dark-field (DF) and high-angle annular-dark field imaging (HAADF). Chemical composition on the atomic level will be determined by energy-dispersive X-ray spectroscopy (EDXS), electron energy-loss spectroscopy (EELS) and energy-loss near-edge structure spectroscopy (ELNES). In connection with the National Centre for Microstructural and Surface Analysis, new specialists in the field of electron microscopy will be trained and new analytical methods implemented.
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