Filters
cris logo
-
New search Filters
Select from list
Displayed from Show more
You have reached the maximum number of displayed search results.
All results displayed
No results are available for the search performed
Displayed from
You have reached the maximum number of displayed search results.
All results displayed
Loading results
Obtaining statistical data

Projects / Programmes source: ARIS

Thin Metallic Film Studied by Synchrotron Radiation

Edit
Research activity

Code Science Field Subfield
1.02.01  Natural sciences and mathematics  Physics  Physics of condesed matter 

Code Science Field
P250  Natural sciences and mathematics  Condensed matter: structure, thermal and mechanical properties, crystallography, phase equilibria 
P260  Natural sciences and mathematics  Condensed matter: electronic structure, electrical, magnetic and optical properties, supraconductors, magnetic resonance, relaxation, spectroscopy 
Keywords
Surface physics, Synchrotron Radiation, Electron Spectroscopy, Thin films, Overlayers
Evaluation (rules)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Researchers (2)
no. Code Name and surname Research area Role Period No. of publications
1.  11546  PhD Dean Cvetko  Physics  Head  2002 - 2004  208 
2.  15703  PhD Janez Kovač  Electronic components and technologies  Researcher  2002 - 2004  683 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  92,018 
Abstract
The research of the proposed project focuses on different heteroepitaxial metal on semiconductor and metal on metal systems where the role of reduced dimensionality, confined film geometry and structural mismatch with the substrate has a substantial impact on the film properties. Multitechnique experiments will be performed at the ALOISA beamline (ELETTRA synchrotron light source) to enlighten the relation between the local geometrical structure and electronic and magnetic behaviour of the grown films. Overlayers of Pb, Sn, In and Fe on various substrates will be studied by means of Grazing Incidence X-ray diffraction, angle resolved photoemission and photoelectron diffraction. The impact of quantum size effects in collective motion of thin metallic films will be studied by thermal He atom scattering available at the TASC-INFM laboratory for surface physics and eventually at the HASPES branchline of the ALOISA beamline. The spectromicroscopical studies of inhomogeneous heteroepitaxial interfaces will be studied at the ESCAMICROSCOPY beamline (ELETTRA synchrotron light source).
Confirmation required
Views history
Favourite