Filters
cris logo
-
New search Filters
Select from list
Displayed from Show more
You have reached the maximum number of displayed search results.
All results displayed
No results are available for the search performed
Displayed from
You have reached the maximum number of displayed search results.
All results displayed
Loading results
Obtaining statistical data

Projects / Programmes source: ARIS

Study of thin organic films and nanostructured materials by synchrotron radiation

Edit
Research activity

Code Science Field Subfield
1.02.00  Natural sciences and mathematics  Physics   

Code Science Field
P250  Natural sciences and mathematics  Condensed matter: structure, thermal and mechanical properties, crystallography, phase equilibria 
P260  Natural sciences and mathematics  Condensed matter: electronic structure, electrical, magnetic and optical properties, supraconductors, magnetic resonance, relaxation, spectroscopy 
P265  Natural sciences and mathematics  Semiconductory physics 
Keywords
Synchrotron radiation, Electron spectroscopy, He scattering, Thin films, Organic films and overlayers, crystal growth, nanoscience
Evaluation (rules)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Researchers (4)
no. Code Name and surname Research area Role Period No. of publications
1.  23565  PhD Gregor Bavdek  Physics  Junior researcher  2004 - 2007  84 
2.  20244  PhD Klemen Bučar  Physics  Researcher  2005 - 2007  180 
3.  11546  PhD Dean Cvetko  Physics  Head  2004 - 2007  206 
4.  15703  PhD Janez Kovač  Electronic components and technologies  Researcher  2004 - 2007  670 
Organisations (2)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  90,695 
2.  1554  University of Ljubljana, Faculty of Mathematics and Physics  Ljubljana  1627007  34,099 
Abstract
Films of simple organic molecules deposited on metal and semiconductor substrates are of relevant scientific interest for a widely spread series of possible applications, spanning from nanostructured electronic devices to sensors, from photo-voltaic systems to bio catalysts, from lubricants to corrosion control systems etc. The research of the proposed project focuses on studying different heteroepitaxial systems like organic molecular films on metallic substrates as well as ultrathin metallic overlayers of uniform thickness on semiconductor systems where the role of reduced dimensionality, confined film geometry and structural mismatch with the substrate as well as particular bonding strength of the organic molecules within the film has a substantial impact on the film macroscopic properties. Organic thin film properties can in fact be tuned by choosing among the many available organic molecules. These systems presents challenges to the conventional theoretical methods employed to calculate electronic and structural properties of covalent systems. On the experimental side, the complexity of these systems requires a multi-techniques approach, where the combined information on the structure, dynamics, morphology and electronic structure is essential to understand the fundamental physics and chemistry involved in the film formation. The present research program aims at enriching the comprehension of the microscopic mechanisms of interface formation, film growth, charge transport within the film and at the interface, by means of diffraction and spectroscopic experimental techniques available at the ALOISA and HASPES beamlines whereas the spectromicroscopical studies of inhomogeneous interfaces will be studied at the Escamicroscopy beamline, which all exploit the advanced characteristics of 3rd generation synchrotron radiation of the Elettra synchrotron light source. In addition, in house research with nondestructive scattering of thermal He atoms as well as diffraction with low energy electrons available at the TASC/INFM laboratory for surface physics will be used to complement the synchrotron measurements
Confirmation required
Views history
Favourite