Filters
cris logo
-
New search Filters
Select from list
Displayed from Show more
You have reached the maximum number of displayed search results.
All results displayed
No results are available for the search performed
Displayed from
You have reached the maximum number of displayed search results.
All results displayed
Loading results
Obtaining statistical data

Projects / Programmes source: ARIS

Raziskave v fiziki površin s sinhrotronsko svetlobo na pospeševalniku Elettra (Slovene)

Edit
Research activity

Code Science Field Subfield
1.02.01  Natural sciences and mathematics  Physics  Physics of condesed matter 

Code Science Field
P250  Natural sciences and mathematics  Condensed matter: structure, thermal and mechanical properties, crystallography, phase equilibria 
P260  Natural sciences and mathematics  Condensed matter: electronic structure, electrical, magnetic and optical properties, supraconductors, magnetic resonance, relaxation, spectroscopy 
Keywords
surfaces, synchrotron radiation, electron spectroscopy, crystal growth
Evaluation (rules)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Researchers (3)
no. Code Name and surname Research area Role Period No. of publications
1.  11546  PhD Dean Cvetko  Physics  Head  1998 - 2001  207 
2.  15703  PhD Janez Kovač  Electronic components and technologies  Researcher  1998 - 2001  673 
3.  03366  Marko Žumer  Electronic components and technologies  Researcher  1998 - 2001  110 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  90,753 
Abstract
Using Elettra synchrotron light source the following topics will be studied : (i) universal scaling laws and dynamical properties during epitaxial crystal growth, (ii) the role of confined geometry (quantum size effects) in dynamics and structure of thin metal film formation, (iii) order disorder phase transitions of clean and adsorbate covered surfaces, (iv) spectromicroscopy of the sub micron structures at the metal/semiconductor interfaces.
Confirmation required
Views history
Favourite