Projects / Programmes source: ARIS

Elektronska mikroskopija ploskovnih napak in mej v keramiki (Slovene)

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Research activity

Code Science Field Subfield
2.04.01  Engineering sciences and technologies  Materials science and technology  Inorganic nonmetallic materials 

Code Science Field
T153  Technological sciences  Ceramic materials and powders 
Keywords
electron microscopy, planar faults, grain boundaries, electronic ceramics
Evaluation (metodology)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Organisations (1) , Researchers (8)
0106  Jožef Stefan Institute
no. Code Name and surname Research area Role Period No. of publications
1.  06627  PhD Slavko Bernik  Materials science and technology  Researcher  1998 - 2001  731 
2.  03937  PhD Miran Čeh  Materials science and technology  Head  1998 - 2001  704 
3.  05216  Medeja Gec    Researcher  1998 - 2001  58 
4.  20825  Boštjan Kaltnekar    Researcher  1998 - 2001  0 
5.  10083  PhD Aleksander Rečnik  Chemistry  Researcher  1998 - 2001  668 
6.  15597  PhD Zoran Samardžija  Materials science and technology  Researcher  1998 - 2001  684 
7.  19030  PhD Sašo Šturm  Materials science and technology  Researcher  1998 - 2001  734 
8.  04295  Jarmila Wernig    Researcher  1998 - 2001  7 
Abstract
Internal interfaces in polycrystalline electronic ceramic materials define electrical properties. The proposed project foresees structural and chemical analysis of planar faults and grain boundaries in alkaline-earth titanates, doped Ba(RE)O3 ceramics and complex perovskites by electron microscopy. The determination of the structure and chemistry of internal interfaces and the understanding of their influence on the microstructure evolution will result in production of better materials.
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