In the paper ublished in a distinguished journal at the field of Mass spectrometry, we reported on the new technique of Imaing Mass Spectrometry (IMS) MeV-SIMS, and its outstanding capacities, combining the sensitivity to the large oranic molecules, which are detected in a form of nonfragmented secondary ions, and high lateral resolution of 800 nm.
COBISS.SI-ID: 32477991
In the frame of the MICE project we installed a channeltron detection kit, which is detecting the arrivals of each primary ion, and is installed behind the sample. We are able to measure exactly the primary ion flux and normalize the yields of secondary ions per single primary ion. We demonstrated that the fragmentation of organic molecules under the MeV-SIMS conditions is decreasing with rising primary energy. In addition, we determined the efficiency of the micro-channel plate detector for large molecular ions.
COBISS.SI-ID: 32889127
During the work on the optimisation of the imaging mass spectrometry MeV-SIMS and the use of linear TOF MS, we explored extremely interesting approach inimaging mass spectrometry, the so-called stigmatic imaging. Here, a broad primary ion beam is used to desorb the secondary molecular ions, and fast position-sensitive detector is used to detect secondary ions, which assigns the position on the detector to the originated position at the sample. The work represent the first successfull stigmatic imaging experiment with MeV-SIMS, demonstrating feasibility and extreme sensitivity to the topographic irregularities of the sample. The complex and unique detector Time-Pix was obtained for testing experiments at JSI from the group of prof. Ron Heeren, Maastricht University, in the frame of long-lasting informal collaboration.
COBISS.SI-ID: 32411431