The probablility for sielectric breakdown within the Mott insulator was evaluated analytically and numerically and the dependence qualitatively differs from previous theoretical proposals.
COBISS.SI-ID: 2522468
It has been shown that the integrable model of Mott insulator reveals the coexistence of normal diffusion at larger momenta and anomalous behavior at smallest momenta, while there is no characteristic transport mean free path.
COBISS.SI-ID: 2522212