We carried out a study of charge multiplication by impact ionization in diamond. Single crystal chemical vapour deposition (scCVD) diamond sensor was subjected to a bias of up to 3000 V. Custom shaped electrodes should, according to simulation, provide local electric fields around 100 V/um. Measurements were performed with a 90Sr source setup. No effects of charge multiplication were observed. Surprisingly for scCVD, even in non-irradiated sensors ample polarization effects due to trapped charge were present. The polarization increased in the detector, irradiated to a modest fluence of 1E14 n/cm2.
D.10 Educational activities
COBISS.SI-ID: 2719076