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Equipment
JEOL JSM-7600F field emission scanning electron microscope
Purpose of equipment
Scanning elecron microscope JEOL JSM-7600F enables observation of the surface of materials with spatial resolution on nm scale (secondary electrons, back-scattered electrons). The microscope also enables determination of chemical composition on micro scale (EDXS, WDXS), determination of crystal texture (EBSD), and is alos equipped with e-litography.
Access of equipment
Responsible for equipment:
PhD Boštjan Markoli
Licensed operators access the microscope via on-line reservation system of the Center for Electron Microscopy (CEM) which is a part of Jožef Stefan Institute. Microscope can only be used by experienced and trained operators. Any outside users can use the equipment only in the presence of a experienced and trained operator.
Licensed operators access the microscope via on-line reservation system of the Center for Electron Microscopy (CEM) which is a part of Jožef Stefan Institute. Microscope can only be used by experienced and trained operators. Any outside users can use the equipment only in the presence of a experienced and trained operator.
ARIS research and infrastructure programmes (1) Legend
| no. | Code | Title | Period | Head | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | P1-0195 | 1/1/2004 - 12/31/2008 | 3,995 |
Organisations (1)
| no. | Code | Research organisation | City | Registration number | No. of publicationsNo. of publications |
|---|---|---|---|---|---|
| 1. | 1555 | Ljubljana | 1627074 | 20,390 |