Equipment
High resolution X-ray computed microtomograph
Microtomography equipment enables non-invasive three-dimensional imaging of the internal structure of materials and samples at high resolution. It is used for analyzing microstructure, measuring porosity, phase distribution, and other internal characteristics of materials. The results provide precise quantitative and qualitative assessment of materials for research, development, and quality control purposes. An additional source allows recording at high energies, while a robotic arm automatically handles sampling and moving the samples.
Responsible for equipment:
PhD Lidija Korat Bensa
Access is only possible upon approval of the person responsible for the device and only under the supervision of a qualified employee. Once a contact has been established, a meeting will be arranged to determine the type, scope and manner of the analysis and to agree a date for carrying out it. The contact details of the responsible person are published on the ZAG website.
ARIS research and infrastructure programmes (1)
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