Equipment source: ARIS

FEG Scanning electron microscope ThermoScientific ESEM FEG Quattro S

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Purpose of equipment
FEG SEM is equipped for imaging with secondary electrons (SEI), backscatter electrons (BEI) and transmission electrons (STEM). It also poses detector for (micro)chemical analysis (EDXS), cooling stage (to -60 °C) and heating stage (to 1000 °C) for insitu dynamic testing
Access of equipment
Responsible for equipment: PhD Aleš Nagode
The equipment is available upon agreement with the operator or with the chief of the laboratory.
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  1555  University of Ljubljana, Faculty of Natural Sciences and Engeneering  Ljubljana  1627074000  19,327 
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