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Equipment source: ARIS

JEOL JSM-7600F field emission scanning electron microscope

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Purpose of equipment
Scanning elecron microscope JEOL JSM-7600F enables observation of the surface of materials with spatial resolution on nm scale (secondary electrons, back-scattered electrons). The microscope also enables determination of chemical composition on micro scale (EDXS, WDXS), determination of crystal texture (EBSD), and is alos equipped with e-litography.
Access of equipment
Responsible for equipment: PhD Boštjan Markoli
URL: http://www.ntf.uni-lj.si/ntf/raziskovanje/raziskovalno-delo/raziskovalna-oprema/
Licensed operators access the microscope via on-line reservation system of the Center for Electron Microscopy (CEM) which is a part of Jožef Stefan Institute. Microscope can only be used by experienced and trained operators. Any outside users can use the equipment only in the presence of a experienced and trained operator.
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P1-0195  Geochemical and structural processes  1/1/2009 - 12/31/2012  PhD Tadej Dolenec  3,929 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  1555  University of Ljubljana, Faculty of Natural Sciences and Engeneering  Ljubljana  1627074  19,864 
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